ASSOCIATION CONNECTING ELECTRONICS …
IPC-9261AIn- process dpmo andEstimated yield for PCAsDeveloped by the dpmo and Assemblies, Attributes and VariablesIdentification Task Group (5-22g) of the Assembly and Joining ProcessesCommittee (5-20) of IPCUsers of this publication are encouraged to participate in thedevelopment of future :IPC3000 Lakeside Drive, Suite 309SBannockburn, Illinois60015-1249Tel 847 847 :IPC-9261 - March 2002ASSOCIATION CONNECTINGELECTRONICS INDUSTRIES Table of ........................................ ............................. ........................................ .......................... and Definitions ........................................ . (Defects per Million Opportunities) ....... (Defects per Unit) ........................................ Step estimated yield ............................... Opportunities (oc).............................. Defect (dc).
IPC-9261A In-Process DPMO and Estimated Yield for PCAs Developed by the DPMO and Assemblies, Attributes and Variables Identification Task Group (5-22g) of the Assembly and Joining Processes
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