GUIDE TO XRF BASICS
BRUKER ADVANCED X-RAY SOLUTIONS ________________________________________ ____________ GUIDE TO XRF BASICS ________________________________________ ____________ This GUIDE was first published in West Germany under the title Introduction to X-ray Fluorescence Analysis (XRF). 2000 - 2006 Bruker AXS GmbH, Karlruhe, West Germany. All rights reserved. Authors: Dr. Reinhold Schlotz, freelance writer and applications scientist, Bruker AXS Dr. Stefan Uhlig, International Sales Manager, Bruker AXS Bruker AXS GmbH stliche Rheinbr ckenstr. 49 D-76187 Karlsruhe Germany Tel: (+49) (721) 595-2888 Fax: (+49) (721) 595-4587 Email: Web: Bruker AXS Inc.
shell electron (Auger effect). The probability of an X-ray resulting from this process is called the fluorescence yield ωωωω. This depends on the element’s atomic number and the shell in which the “hole” occurred. ωωωω is very low for light elements (approx. 10 -4 …
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