Simultaneous atomic-resolution electron …

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ARTICLEReceived 22 Dec 2015|Accepted 8 Jul 2016|Published 26 Aug 2016Simultaneous atomic - resolution electronptychography andZ-contrast imaging of lightand heavy elements in complex nanostructuresH. Yang1, Rutte2, L. Jones1, M. Simson3, R. Sagawa4, H. Ryll5, M. Huth3, Pennycook6, Green2,H. Soltau3, Y. Kondo4, Davis2& Nellist1The aberration-corrected scanning transmission electron microscope (STEM) has emergedas a key tool for atomic resolution characterization of materials, allowing the use of imagingmodes such asZ-contrast and spectroscopic mapping. The STEM has not been regarded asoptimal for the phase-contrast imaging necessary for efficient imaging of light , recent developments in fast electron detectors and data processing capability is shownto enable electron ptychography, to extend the capability of the STEM by allowingquantitative phase images to be formed simultaneously wit

F orming an atomic-resolution image in the electron microscope that provides dose-efficient, high-contrast imaging of light elements, while also providing strong

  Atomic, Electron, Resolution, Simultaneous, Simultaneous atomic resolution electron