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Agilent De-embedding and Embedding S-Parameter …
Application Note 1364-1 AgilentDe- Embedding and EmbeddingS-Parameter Networks Using aVector Network Analyzer2 IntroductionTraditionally RF and microwave com-ponents have been designed in pack-ages with coaxial interfaces. Complexsystems can be easily manufacturedby connecting a series of these sepa-rate coaxial devices. Measuring theperformance of these componentsand systems is easily performed withstandard test equipment that usessimilar coaxial interfaces. However, modern systems demand ahigher level of component integra-tion, lower power consumption, andreduced manufacturing cost. RFcomponents are rapidly shiftingaway from designs that use expen-sive coaxial interfaces, and are mov-ing toward designs that use printedcircuit board and surface mounttechnologies (SMT). The traditionalcoaxial interface may even be elimi-nated from the final product. Thisleaves the designer with the prob-lem of measuring the performanceof these RF and microwave compo-nents with test equipment thatrequires coaxial interfaces.
ding. Direct measurement requires specialized calibration standards that are inserted into the test fix-ture and measured. The accuracy of the device measurement relies on the quality of these physical stan-dards.2 De-embedding uses a model of the test fixture and mathematical-ly removes the fixture characteris-tics from the overall measurement.
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