Transcription of Agilent De-embedding and Embedding S-Parameter …
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Application Note 1364-1 AgilentDe- Embedding and EmbeddingS-Parameter Networks Using aVector Network Analyzer2 IntroductionTraditionally RF and microwave com-ponents have been designed in pack-ages with coaxial interfaces. Complexsystems can be easily manufacturedby connecting a series of these sepa-rate coaxial devices. Measuring theperformance of these componentsand systems is easily performed withstandard test equipment that usessimilar coaxial interfaces. However, modern systems demand ahigher level of component integra-tion, lower power consumption, andreduced manufacturing cost. RFcomponents are rapidly shiftingaway from designs that use expen-sive coaxial interfaces, and are mov-ing toward designs that use printedcircuit board and surface mounttechnologies (SMT). The traditionalcoaxial interface may even be elimi-nated from the final product. Thisleaves the designer with the prob-lem of measuring the performanceof these RF and microwave compo-nents with test equipment thatrequires coaxial interfaces.
shift the measurement plane to the DUT plane by rotating the phase angle of the measured S-parameters (Figure 6). If we assume the phase angles, ...
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