Transcription of Analog-to-Digital Converter Testing - mit.edu
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Analog-to-Digital Converter Testing - mit.edu
analog -to-DigitalConverterTestingKent essential buildingblocks in criticallinkbetween front-endanalogtransducersandback-enddig italcomputersthatcan e ciently implement a widevariety of of digital-signal-processingapplicationslea dsto the availability of a widevariety of Analog-to-Digital (A/D)convertersof varyingprice,performance,and , an A/Dconverterencodes a continuous-timeanaloginputvoltage,VIN, into a seriesofdiscreteN-bit digitalwordsthatsatisfythe relationVIN=VFSN 1Xk=0bk2k+1+ whereVFSis the full-scalevoltage,bkare the individualoutputbits,and is the alsobe writtenin termsof the leastsigni cant bit (LSB)or quantumvoltagelevelVQ=VFS2N= 1 LSBasVIN=VQN 1Xk=0bk2k+ A plotof this idealcharacteristicfor a 3-bitA/Dconverteris shown in OutputAnalog Input1/801/43/81/25/83/47/8 FScentercode= 1 LSBcode widthFigure1: uniquedigitalcode correspondsto a smallrangeof LSBwide(the\code width")and is centeredaroundthe \code center.
Analog-to-Digital Converter Testing Kent H. Lundberg Analog-to-digitalconvertersareessentialbuildingblocksinmodernelectronicsystems.They ...
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