Transcription of BE (eV) RSF - XPS Data
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BE (eV) RSF - XPS Data
Al2O3Al2O3Al2O3(99%), analyzed at 90 deg TOA, mesh at 1mm, non-conductivefused into clear glass 1 mm thick, mp 2040 C, d IDCorrected BE (eV)Measured BE (eV)Scofield RSFRSF ExponentNormalized Peak AreaAtomic %O 2s ,578Al 2p , loss ,485Si 2p ,122Al 2s ,744Al loss ,965Si 2s , 1s , loss ,508Ag 3d , 1s , Auger ,270O 1s , loss ,458O Auger ,773 Description: 2005 XPS International LLCS urface Composition TableAluminum (III) Oxide (FW = )Handbooks of Monochromatic XPS SpectraVolume Two - Commercially Pure Binary Oxides43 Sample Description: Al2O3 (99%) fused into glass 1mm thickanalyzed as received at 90 deg TOA , mesh-screen at 1mmCountsBinding Energy, eV10009008007006005004003002001000500010 0001500020000250003000035000400004500050 000550006000065000 Peak IDAtomic %BE (eV)O 1s 3d 2s AugerO loss O 1sNa AugerN 1sAg 3dC loss C 1sSi 2sAl loss O 2sSi 2pAl lossAl 2sAl 2pAluminum (III) Oxide (FW = )Al2O3Al2O3 2005 XPS International LLCS ur
Al2O3 Al2O3 Al 2O 3 (99%), analyzed at 90 deg TOA, mesh at 1mm, non-conductive fused into clear glass 1 mm thick, mp 2040 C, d 3.97 Peak ID Corrected BE (eV) Measured BE (eV) ...
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