Chapter 4. Basic Failure Modes and Mechanisms

89 Chapter 4. Basic Failure Modes and MechanismsS. KayaliFailures of electronic devices, in general, can be catastrophic or failures render the device totally nonfunctional, while noncatastrophicfailures result in an electrically operating device that shows parametric degradation andlimited Chapter provides a description of some of the more common Failure modesand Mechanisms affecting GaAs-based MMICs. The current understanding of the topicwill be presented along with a discussion of some possible solutions, practiced processimprovements, and Failure ModesGaAs devices exhibit some general Failure Modes that can be attributed to adefined Failure mechanism. The most common Failure Modes are observed viadegradation of the MMIC parameters such as IDSS, gain, POUT, and others.

This failure mode is generally observed in devices subjected to an accelerated life test or to high operating temperatures. The degradation is observed as an increase in the gate leakage current over the duration of the test. No experimentally identified failure mechanisms have been linked to this failure mode, but surface-state effects have been

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