Transcription of Chapter 4. Basic Failure Modes and Mechanisms
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Chapter 4. Basic Failure Modes and Mechanisms
89 Chapter 4. Basic Failure Modes and MechanismsS. KayaliFailures of electronic devices, in general, can be catastrophic or failures render the device totally nonfunctional, while noncatastrophicfailures result in an electrically operating device that shows parametric degradation andlimited Chapter provides a description of some of the more common Failure modesand Mechanisms affecting GaAs-based MMICs. The current understanding of the topicwill be presented along with a discussion of some possible solutions, practiced processimprovements, and Failure ModesGaAs devices exhibit some general Failure Modes that can be attributed to adefined Failure mechanism.
Hydrogen-related degradation may cause the same observed pinch-off voltage degradation effects [1]. This degradation is theorized to be caused by either a reduction of carrier concentration in the active channel of the device or a change in the surface state built-in potential. Further information on this degradation is found in Section II.D.2.
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