Transcription of Crystallite Size Measurement Using X-ray Diffraction
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Department of Chemical Engineering and Materials ScienceMike MeierUniversity of California, DavisSeptember 13, 2004 Figure 1. FEG-SEM image of nanosized aluminum oxide powder. Note themagnification and the size of the micron bar. Also note how the smaller particlesand the edges of the larger particles appear to be somewhat transparent. This isbecause much of the 5 kV electron beam can pass through these thinner parts of size Measurement Using X-ray Diffraction IntroductionPhase identification Using X-ray Diffraction relies mainly on the positions of the peaks in a diffractionprofile and to some extent on the relative intensities of these peaks. The shapes of the peaks,however, contain additional and often valuable information. The shape, particularly the width, ofthe peak is a measure of the amplitude of thermal oscillations of the atoms at their regular latticesites.
Department of Chemical Engineering and Materials Science Mike Meier University of California, Davis September 13, 2004 Figure 1. FEG-SEM image of nanosized aluminum oxide powder.
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