Determination of Residual Stresses by X-ray …

A NATIONAL MEASUREMENTGOOD PRACTICE GUIDED etermination of Residual Stresses by X-ray diffraction - Issue 2No. 52 The DTI drives our ambition of prosperity for all by working tocreate the best environment forbusiness success in the help people and companiesbecome more productive bypromoting enterprise, innovationand champion UK business at homeand abroad. We invest heavily inworld-class science and protect the rights of workingpeople and consumers. And westand up for fair and open marketsin the UK, Europe and the Guide was developed by the NationalPhysical Laboratory on behalf of the NMS. Measurement Good Practice Guide No. 52 Determination of Residual Stresses by X-ray diffraction Issue 2 Fitzpatrick1, Fry2, P. Holdway3, Kandil2, J. Shackleton4 and L. Suominen5 1 Open University, 2 National Physical Laboratory, 3 QinetiQ, 4 Manchester Materials Science Centre, 5 Stresstech Oy Abstract: This Guide is applicable to X-ray stress measurements on crystalline materials.

Measurement Good Practice Guide No. 52 1 1 Introduction In measuring residual stress using X-ray diffraction (XRD), the strain in the crystal lattice is measured and the associated residual stress is determined from the elastic constants assuming a linear elastic distortion of the appropriate crystal lattice plane.

Tags:

  Determination, Residual, Diffraction, Stresses, Determination of residual stresses by

Information

Related search queries