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EEE-INST-002: Instructions for EEE Parts Selection ...

NASA/TP 2003 212242 EEE-INST-002: Instructions for EEE Parts Selection , Screening, Qualification, and Derating Prepared by: Dr. Kusum Sahu Reviewed by: Dr. Henning Leidecker Approved by: Darryl LakinsApril 2008, Incorporated Addendum 1 National Aeronautics and Space Administration Goddard Space Flight Center Greenbelt, Maryland 20771 May 2003 ENCLOSURE 1: Addendum 1 for GSFC EEE-INST-002 Connector Section C2, General Section, added new paragraphs 5), 6), and 7) on Page 2. 5) Prohibited connectors. The following connectors are prohibited for Level 1 and Level 2 applications. The following connectors are not recommended for Level 3 applications. The screening and qualification tables that follow do not apply to connectors listed as prohibited.

MIL- STD-883 Test Method Standard, Microcircuits MIL- STD-750 Test Methods for Semiconductor Devices MIL-STD-202 Test Method Standard, Electronic and Electrical Component Parts MIL-STD-1580 Test Method Standard, Destructive Physical Analysis for EEE Parts Industry Standards ASTM E595 Standard Test Methods for Total Mass Loss and …

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nepp.nasa.gov

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nepp.nasa.gov

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nepp.nasa.gov

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nepp.nasa.gov

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