Transcription of EO Probing Unit - Hamamatsu Photonics
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EO Probing Unit - Hamamatsu Photonics
Electro Optical Probing UnitPHEMOS-1000 THEMOS-1000iPHEMOS-MPTriPHEMOSEOPE lectro Optical ProbingEOFME lectro Optical Frequency MappingFeaturesApplicationsFeaturesAppli cationsInstant capture of operating waveformsVisualization of transistors out of targeted frequencySave EOP target identification time by acquiring multiple images simultaneouslyQuick detection of timing delay using phase animation imagesHigh quality pattern image with no interference fringesMeasurement of transistors operating waveformsCharacterization and debug of active circuitPattern imageLocalize failure points through transistor frequency mapping and waveform characterizationWide range of operating frequency 10 kHz - 1 GHzMaximum 500 000 sampling points for a long test loopCapture EOP waveforms in 2 secondsI/Q imageAmplitude imagePhase imageObservation on structural failure of scan chainIdentification of a Probing point from EOFM images Validation of digital and analog circuits Oscillating circuit Timing defect check of IO circuit5 nsDelayElement 1 Element 2 Element 3 Element 4 Element 5 Element 6 Signal flowE
Electro Optical Probing Unit PHEMOS-1000 THEMOS-1000 iPHEMOS-MP TriPHEMOS EOP Electro Optical Probing EOFM Electro Optical Frequency Mapping Features
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