EXTENDED PERFORMANCE 200MM Higher test cell utilization ...

4090 +Test Managers Are Driven To Reduce Rising Test CostsAgreater portion of the total chip manufacturingcost is now spent on test as devices become morecomplex and smaller. Test floor managers aretasked with driving down the cost of test and operating their test floors as efficiently as Test Cell Efficiency and Increased CapabilitiesThe requirement for lower test cell costs, combined with new wafer test requirements for the latest device types, has prompted manufacturers to search for new ways to improvetheir test cell efficiency while expanding theirapplication PERFORMANCE for 200mmProductivity BreakthroughElectroglas has undertaken a whole new approachto enhancing its flagship 200MM wafer probersystem.

4090µ+ Test Managers Are Driven To Reduce Rising Test Costs A greater portion of the total chip manufacturing cost is now spent on test as devices become more

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