IC Opens/Shorts Testing - Checksum

IC Page 1 of 16 29-April-2014 IC Opens/Shorts Testing Test Philosophy The tester is used to test an IC for any opens and/or shorts on any IC connection (pin/BGA). The test of the IC is intended to insure that all common pins are connected to the same network of pins, independent pins make a connection to the die, and there are no shorted pins. The continuity test verifies the common pins are connected and that no pins are shorted. Additional tests are used to insure all the independent pins make a connection to the die. The typical test to insure all the independent pins make a connection to the die is some type of impedance test from the independent pin to another network or pin. The tester does not perform parametric Testing of the IC.

IC Testing.docx Page 1 of 16 29-April-2014 IC Opens/Shorts Testing Test Philosophy The tester is used to test an IC for any opens and/or shorts on any IC connection (pin/BGA).

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