Transcription of IEC 61000-4-x Tests for TI s Protection Devices
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IEC 61000-4-x Tests for TI s Protection Devices
ApplicationReportSLVA711 June2015 IEC 61000-4-xTestsfor TI s ProtectionDevicesABSTRACTTheIEC 61000-4-Xset of standardsare usedto test or moreof the testslistedwithinthe IEC 61000-4-Xspecificationto complywithreliabilitystandardsfor end documentare the threemostcommonteststhat TexasInstrument s protectiondevicescomplyto: SystemESDI mmunity(IEC61000-4-2),ElectricalFastTran sientImmunity(EFT)(IEC61000-4-4),andLigh tning/SurgeImmunity(IEC61000-4-5).Inaddi tionto an overviewof the specification,we will providea test setupoverviewfor 61000-4-2 OverviewThe IEC be veryharmfulto a systemand evena smallamountof voltagecan of IEC ESDprotection,as any useraccessibleareascan be subjectedto test is considereda 'systemlevel'test, TI measuresthe immunityof individualprotectiondevicestoprovidecust omerswith an idea of how high theirsystemwill passwith TI protectiondevicesin the moreinformationon what s importantin selectingan ESDdevice,see the TI applicationnoteDesignConsiderationsfor System-LevelESDC ircuitProtection(SLYT492).
Level Open-Circuit Test Voltage ±10% kV 1 0.5 2 1.0 3 2.0 4 4.0 X(1) Custom (1) X can be any level above, below or in between the other levels. This level can be specified in the product standard. • Class 1: Partly protected electrical environment. • Class 2: Electrical environment where the cables are well-separated, even at short runs.
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