Transcription of IEEE standard test access port and boundary-scan ...
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IEEE standard test access port and boundary-scan ...
The Institute of Electrical and Electronics Engineers, Park Avenue, New York, NY 10016-5997, USAC opyright 2001 by the Institute of Electrical and Electronics Engineers, rights reserved. Published 23 July 2001. Printed in the United States of : ISBN 0-7381-2944-5 SH94949 PDF: ISBN 0-7381-2945-3 SS94949No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the Std (Revision of IEEE Std )IEEE standard Test access Port and boundary-scan ArchitectureSponsorTest Technology Standards Committeeof theIEEE Computer SocietyApproved 14 June 2001 IEEE-SA Standards BoardAbstract.
IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board. The IEEE develops its standards through a consensus develop-ment process, approved by the American National Standards Institute, which brings together volunteers …
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