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IPC/JEDEC J-STD-020D

AN0024 Issue 3 CN# P109275 IPC/JEDEC J-STD-020D Moisture/Reflow Sensitivity Classification for Non-hermetic Solid State Surface Mount Devices Syfer Surface Mount Capacitor Test Results Introduction ..2 Moisture Sensitivity Classification Process ..2 Initial Electrical Test ..2 Initial Visual ..2 Bake ..2 Moisture Soak ..2 Reflow x 3 ..3 Final External Visual ..3 Final Electrical Test ..3 Final Internal Visual Examination ..3 Failure Criteria ..4 Syfer Test Summary ..5 Results ..5 Appendix 1 Capacitor Photographs ..6 Syfer Technology Limited, Old Stoke Road, Arminghall, Norwich, Norfolk, NR14 8SQ, United Kingdom Tel: +44 (0) 1603 723300 Tel. (Sales): 01603 723310 Fax: +44 (0) 1603 723301 Email: Web: Application Note Reference No: AN0024 IPC/JEDEC J-STD-020D Issue 3 Page 2 of 8 Introduction The purpose of J-STD-020 is to identify the moisture sensitivity classification level of non-hermetic solid state surface mount devices (SMDs).

2.5 Reflow x 3 Within 15 minutes to maximum 4 hours after the moisture soak, capacitors subjected to 3x reflow soldering profile. Reflow soldering profile used by Syfer: 2.6 Final External Visual Capacitors externally visually examined using 50x magnification. 2.7 Final Electrical Test Capacitors tested for: Capacitance

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