Transcription of IPC-TM-650 High Speed/High Frequency Test Methods TEST ...
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IPC-TM-650 High Speed/High Frequency Test Methods TEST ...
SummaryThis method is for measurement of relativepermittivity ( r) and dissipation factor or loss tangent (tan )ofcircuit board substrates under stripline conditions. Measure-ments are made by measuring resonances of a length of strip-line over a wide Frequency range from below 1 GHz to about14 GHz(1,2). The method permits a wide variety of specimenconfigurations, varying in dielectric thickness, width of centerconductor, and use of clad or laid up conductor foil(3). Sensi-tivity to differences in tan are enhanced by the ability toadjust the degree of coupling to the resonator by adjusting anair gap between probes and the resonator ends.
1.0 Scope 1.1 Summary This method is for measurement of relative permittivity (ε r) and dissipation factor or loss tangent (tan δ)of circuit board substrates under stripline conditions. Measure-ments are made by measuring resonances of a length of strip-
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