Transcription of IPC-TM-650 TEST METHODS MANUAL
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IPC-TM-650 TEST METHODS MANUAL
1 ScopeThis test method provides a means to assess the propen-sity for conductive anodic filament (CAF) growth, a form ofelectrochemical migration, and similar conductive filament for-mation (CFF) laminate material failure modes within a printedwiring board (PWB). Conductive anodic filaments may becomposed of conductive salts, rather than cationic metal ions,however inadequate dielectric for the applied voltage, compo-nent failures, and part use exceeding the maximum operatingtemperature (MOT) of the laminate can contribute to productfailures as well.
PWB manufacturing process changes and press-fit connector ... change in pad sizes, the four structures are identical. ... Figure 1 Layouts of Two Versions of the CAF Test Boards D1 A1 A2 A3 A4 B1 B2 B3 B4 C1 C2 C3 C4 D2 Area of PTHs for Test Wire Attachment D1 A1 A2 A3 A4 B1 B2 B3 B4 C1 C2 C3 C4 D2 Area of PTHs for Test Wire Attachment a) IPC ...
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