Transcription of MIL-STD-750D, Test Methods for Semiconductor Devices
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MIL-STD-750D, Test Methods for Semiconductor Devices
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c. The test methods described herein for environmental, physical, and electrical testing of devices shall also apply, when applicable, to parts not covered by an approved military sheet-form standard, specification sheet, or drawing. 1.2 Numbering system. The test methods are designated by numbers assigned in accordance with the following system:
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