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MIL-STD-750D, Test Methods for Semiconductor Devices

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Test methods numbered 5000 to 5999 inclusive are for high reliability space applications. 1.2.2 Revisions. Revisions are numbered consecutively using a period to separate the test method number and the revision number. For example, 4001.1 is the first revision of test method 4001. 1.3 Method of reference.

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