Transcription of MIL-STD-750D, Test Methods for Semiconductor Devices
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MIL-STD-750D, Test Methods for Semiconductor Devices
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applicable, to parts not covered by an approved military sheet-form standard, specification sheet, or drawing. 1.2 Numbering system. The test methods are designated by numbers assigned in accordance with the following system: 1.2.1 Classification of tests. The tests are divided into five areas. Test methods numbered 1001 to 1999 inclusive, cover
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