Transcription of MIL-STD-883E, Test Method Standard for Microcircuits
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MIL-STD-883E, Test Method Standard for Microcircuits
0,/ 67' ( '(&(0%(5 '(&(0%(5 683(56(',1* 683(56(',1*0,/ 67' '0,/ 67' ' 129(0%(5 129(0%(5 '(3$570(17 2) '()(16('(3$570(17 2) '()(16(7(67 0(7+2' 67$1'$5'7(67 0(7+2' 67$1'$5'0,&52&,5&8,760,&52&,5&8,76$06& 1 $ )6& ',675,%87,21 67$7(0(17 $',675,%87,21 67$7(0(17 $ $SSURYHG IRU SXEOLF UHOHDVH GLVWULEXWLRQ LV XQOLPLWHG $SSURYHG IRU SXEOLF UHOHDVH GLVWULEXWLRQ LV XQOLPLWHG 7KH GRFXPHQWDWLRQ DQG SURFHVVFRQYHUVLRQ PHDVXUHV QHFHVVDU\ WRFRPSO\ ZLWK WKLV UHYLVLRQ VKDOO EHFRPSOHWHG E\ 0D\ ,1&+ 3281',1&+ 3281'MIL-STD-883 EiiFOREWORD1. This military Standard is approved for use by all Departments and Agencies of the Department of Defense.*2. Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving thisdocument should be addressed to: Defense Supply Center Columbus, Box 3990, Columbus, OH 43216-5000, by usingthe self-addressed Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this document orby Intended use of or reference to Government Non-Government Order of , SYMBOLS, AND Abbreviations, symbols, and Numbering Test Test sample Test General 16 FIGURESFIGURE1.))))))))))))))))))))))))) )))
3016 Activation time verification ... 3020 High impedance (off-state) low-level output leakage current 3021 High impedance (off-state) high-level output leakage current 3022 Input clamp voltage ... 4005.1Output performance 4006.1Power gain and noise figure 4007 Automatic gain control range. MIL-STD-883E vi TEST METHODS
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