Transcription of PACKAGE QUALIFICATION SUMMARY REPORT
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PACKAGE QUALIFICATION SUMMARY REPORT Document Control #: ML1120110066 Purpose: To provide QUALIFICATION SUMMARY REPORT for all packages Device: Various Mask Identification #: Various Process Technology: Pure Matte Tin (Sn) Plating Process 400 in (10 m) 1000 in (25 m), Pre-Plated Leadframe (PPF), or SnAgCu based solder bump Product: Various devices plated with Matte Tin, PPF, or with solder spheres Updated: May 18, 2017 PACKAGE QUALIFICATION SUMMARY REPORT DOCUMENT CONTROL # ML1120110066 Microchip Technology Inc.
Package Qualification Summary Report DOCUMENT CONTROL # ML1120110066 Microchip Technology Inc. 6 2 RELIABILITY TEST DESCRIPTIONS 2.1 Preconditioning
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By Scott Speaks Vicor Reliability, Test, Humidity, Temperature, General Specification Electrical Function General, Highly Accelerated Stress Test, JEDEC STANDARDS, TEMPERATURE HUMIDITY, Reliability Report 2018, Reliability, Stress, Power Semiconductor Reliability Handbook, Information about Dow, Brand, Brand Adhesive/Sealants