Transcription of Part I: Introduction to Nanoparticle Characterization with AFM
{{id}} {{{paragraph}}}
Part I: Introduction to Nanoparticle Characterization with AFMJ ennifer Scalf, Paul WestPacific Nanotechnology, Scott Blvd., Suite 29 Santa Clara, CA I: Introduction to Nanoparticle Characterization with for nanoparticles While nanoparticles are important in a diverse set of fields, they can generally be classified as one of two types: engineered or nonengineered. Engineered nanoparticles are intentionally designed and created with physical properties tailored to meet the needs of specific applications . They can be end products in and of themselves, as in the case of quantum dots or pharmaceutical drugs, or they can be components later incorporated into separate end products, such as carbon black in rubber products, shown in Figure 1. Either way, the particle s physical properties are extremely important to their performance and the performance of any product into which they are ultimately incorporated.
Part I: Introduction to Nanoparticle Characterization with AFM 1 Revision.1/16/06.A Applications for Nanoparticles While nanoparticles are important in a diverse set of fields, they
Domain:
Source:
Link to this page:
Please notify us if you found a problem with this document:
{{id}} {{{paragraph}}}
Applications of transmission electron microscopy, Ion Beam Sputtering: Practical Applications to Electron, Applications, Electron, Transmission, Magnification Standards for SEM, Light, Microscopy, Single Bond 2 Adhesive, Measure and Modify Colloidal Stability, Processing of Nickel Ores & Concentrates ‘10 Falmouth