Transcription of Time-of-Flight Mass Spectrometry - Agilent
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Time-of-Flight Mass Spectrometry - Agilent
Time-of-Flight Mass SpectrometryTechnical OverviewIntroductionTime-of-flight mass Spectrometry (TOF MS) was developed in the late 1940 s, butuntil the 1990 s its popularity was limited. Recent improvements in TOF technology,including orthogonal acceleration, ion mirrors (reflectron), and high-speed electron-ics, have significantly improved TOF resolution. This improved resolution, combinedwith well proven rugged ion sources and quadrupole mass filter technology makesQ-TOF GC-MS a core technology for the analysis of small molecules that areamenable to separation by gas overview describes: Basic theory of operation for an orthogonal acceleration Time-of-Flight (oa-TOF)mass spectrometer Flight time and the fundamental equations for TOF mass analysis TOF measurement cycle Relative advantages of the two most common TOF digitizers analog-to-digitalconverter (ADC) and time-to-digital converter (TDC) Theoretical and practical
The more parallel the ion beam, the higher the resolving power that can be achieved. After the ions have been shaped into a parallel beam, they pass through a pair of slits into the third and last vacuum stage. where the time-of-flight mass analysis takes place. Because the mass of each ion is assigned based on its flight time, the
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