Transcription of Versa 3D DualBeam - FEI
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Versa 3D DualBeam - FEI
Versa 3D DualBeam Versatility for demanding 3D characterization, prototyping and in situ research needs Building on the history and success The ultra-large chamber allows addition of a variety of accessories and detectors to support a broad range of of FEI's pioneering DualBeam , imaging and analytical techniques, accessing information from every angle. high -resolution, low vacuum and With Versa 3D the choice is yours to optimize the system ESEM expertise, FEI introduces the for conductive samples in high vacuum; non-conductive samples with low vacuum; or expand the horizons of research to most versatile DualBeam instrument dynamic applications.
Versa 3D essential specifications Electron optics · High-resolution field emission SEM column optimized for high-brightness/ high-current · Schottky thermal field emitter
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