Transcription of Versa 3D DualBeam - FEI
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Versa 3D DualBeam - FEI
Versa 3D DualBeam Versatility for demanding 3D characterization, prototyping and in situ research needs Building on the history and success The ultra-large chamber allows addition of a variety of accessories and detectors to support a broad range of of FEI's pioneering DualBeam , imaging and analytical techniques, accessing information from every angle. high-resolution, low vacuum and With Versa 3D the choice is yours to optimize the system ESEM expertise, FEI introduces the for conductive samples in high vacuum; non-conductive samples with low vacuum; or expand the horizons of research to most versatile DualBeam instrument dynamic applications.
Versa 3D DualBeam Versatility for demanding 3D characterization, prototyping and in situ research needs Building on the history and success of FEI’s pioneering DualBeam™
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