Versa 3D DualBeam - FEI

Versa 3D DualBeam Versatility for demanding 3D characterization, prototyping and in situ research needs Building on the history and success The ultra-large chamber allows addition of a variety of accessories and detectors to support a broad range of of FEI's pioneering DualBeam , imaging and analytical techniques, accessing information from every angle. high-resolution, low vacuum and With Versa 3D the choice is yours to optimize the system ESEM expertise, FEI introduces the for conductive samples in high vacuum; non-conductive samples with low vacuum; or expand the horizons of research to most versatile DualBeam instrument dynamic applications. to date. The Versa 3D offers KEY BENEFITS. state-of-the-art imaging and DualBeam functionality to examine surface and sub-surface areas analytical performance to deliver a of any sample (sample modification at the nm and m scale). High quality TEM and atom probe sample preparation with low greater range of 3D data from even voltage cleaning for atomic level study by TEM/atom probe.

Versa 3D DualBeam Versatility for demanding 3D characterization, prototyping and in situ research needs Building on the history and success of FEI’s pioneering DualBeam™

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  Saver, Prototyping, Versa 3d dualbeam, Dualbeam

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