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Vertical Probe Mechanical & Thermal-electrical ...

Vertical Probe Mechanical & Thermal-electrical characterization using Finite Element AnalysisYan ChenSV TCL An SV Probe CompanyOverview Objective Modeling Approach: SPM vs. ALM ALM Convergence TrioTMProbe Model BCF Deflection Stress Profile Scrub Thermal-electrical Behavior Other Vertical Probe Models: SmartTouchTM Conclusion2 Yan ChenObjective Speedy Vertical Probe characterization with validated FEA Probe models BCF Validation DOE Size Reduction Performance evaluation of Vertical probes at extreme testing conditions CCC under high temperature & high current3 Yan ChenModeling Approach4 Yan Probe Model(SPM)Assembly Level Model(ALM) Single Probe Model (SPM) Probe only geometry Artificial boundary conditions Linear system with short runtime Higher stiffness than the experimental setup Assembly Level Model (ALM)

Vertical Probe Mechanical & Thermal-electrical Characterization using Finite Element Analysis Yan Chen SV TCL –An SV Probe Company

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