XRD for the analyst

X-RAY POWDER diffraction . XRD for the analyst Getting acquainted with the principles Martin Ermrich n = 2d sin Detlef Opper The Analytical X-ray Company X-RAY POWDER diffraction . XRD for the analyst Getting acquainted with the principles Martin Ermrich Detlef Opper XRD for the analyst Published in 2011 by: PANalytical GmbH. N rnberger Str. 113. 34123 Kassel +49 (0) 561 5742 0. All rights reserved. No part of this publication may be reproduced, stored in a retrieval system or transmitted in any form by any means electronic, mechanical, photocopying or otherwise without first obtaining written permission of the copyright owner. 2nd revised edition published in 2013 by: PANalytical Lelyweg 1, 7602 EA Almelo Box 13, 7600 AA Almelo, The Netherlands Tel: +31 (0)546 534 444. Fax: +31 (0)546 534 598. ISBN: 978-90-809086-0-4. We encourage any feedback about the content of this booklet. Please send to the address above, referring to XRD_for_the_analyst. 2. XRD for the analyst Contents 1.

crystallite size, preferred orientation effects and residual stress in polycrystalline engineered materials. Many of these techniques can also be used for poly-crystalline layered materials such as coatings. Other X-ray diffraction techniques include high-resolution analysis of hetero-

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  Stress, Residual, Diffraction, Ray diffraction, Residual stress

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