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X-ray Diffraction (XRD)

X-ray Diffraction (XRD)

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• To determine structural properties: Lattice parameters (10-4Å), strain, grain size, expitaxy, phase composition, preferred orientation (Laue) order-disorder transformation, thermal expansion • To measure thickness of thin films and multi-layers* • To determine atomic arrangement • Detection limits: ~3% in a two phase mixture; can be

  Structural, Properties, Structural properties

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