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ASSEMBLY CONCERNS FOR TEST IN STRIP - …
ASSEMBLY CONCERNS FOR TEST IN STRIP Bob Fenton Electroglas, Inc. San Jose, CA, USA ABSTRACT Over the last few years, many of the world’s leading
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Wafer Probe Acquires a New Importance in Testing
www.electroglas.comhe paradigm for test is changing rapidly. Originally, for example, testing at wafer probe was employed for two purposes: The first was to weed out
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www.electroglas.com5/06 Fine pitch capability Using the same proven platen motor technology, with frictionless air bearings, accuracy performance is increased by 25%.
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