nano-TA: Enable your AFM perform sub-100nm …

1 Jul-06 AFM DSC 100 ( ) 160-0023 1-5-11 5F PH03-5339-1470 Fax03-5339-1471 Email 542-0081 1-12-3 3F PH06-4705-5587 Fax06-6260-1113 100nm nano -TA AFM nano -TA AFM nano -TA 3 GT-1 1 Infrared Microscopy200 m200 m 1 SEM 2 nano -TA 2 Cantilever Electrical Resistance (k)

2 Cantilever Power (mW) Cantilever Electrical Resistance (k )Tip Temperature (oC) 3 4 3 4 550 C 550 C AN GT-1 5 6 SEM 5 6 7,8 nano -TA 30nm 7 PCL 2 7 7 8 1 8 8 nano -TA 9 2 1 90nm 90nm 9 GT-1AN-1 AN-2 ( ) 200-350200-300 200-300 ( ) 112 ( ) 13-53-5 (N/m) (kHz)50-10020-4030-50 (nm) <40<20 <20 ( C) ~500 ~250 ~250 (C)Deflection (V)

3 10 PEO PEO 65 C 3 C 10 nano -TA 0200400600800100012000100002000030000400 005000060000 Cantilever deflection (ADC units)Temperature Melting 60oCPCL020040060080010000100002000030000 400005000060000 Cantilever deflection (ADC units)TemperaturePETM elting 240oCPETV oltage (mV) nano -TA 11 12 PCL (PET) 3 13 13 14 ( ) 160-0023 1-5-11 5F PH03-5339-1470 Fax03-5339-1471 542-0081 1-12-3 3F PH06-4705-5587 Fax06-6260-1113