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Failure Mode Failure Effect
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Understanding Functional Safety FIT Base Failure Rate ...
www.ti.comThe IEC TR 62380 IC failure rate can be modeled as sum of the die, package and electrical overstress (EOS) related failure rates, where: • The die-related failure rate formula includes terms for IC type and IC technology, transistor count, thermal mission profile, junction temperature, and operating and non-operating lifetime.