IEC 61000-4-x Tests for TI s Protection Devices

1 ApplicationReportSLVA711 June2015 IEC 61000-4-xTestsfor TI s ProtectionDevicesABSTRACTTheIEC 61000-4-Xset of standardsare usedto test or moreof the testslistedwithinthe IEC 61000-4-Xspecificationto complywithreliabilitystandardsfor end documentare the threemostcommonteststhat TexasInstrument s protectiondevicescomplyto: SystemESDI mmunity(IEC61000-4-2),ElectricalFastTran sientImmunity(EFT)(IEC61000-4-4),andLigh tning/SurgeImmunity(IEC61000-4-5).Inaddi tionto an overviewof the specification,we will providea test setupoverviewfor 61000-4-2 OverviewThe IEC be veryharmfulto a systemand evena smallamountof voltagecan of IEC ESDprotection,as any useraccessibleareascan be subjectedto test is considereda 'systemlevel'test, TI measuresthe immunityof individualprotectiondevicestoprovidecust omerswith an idea of how high theirsystemwill passwith TI protectiondevicesin the moreinformationon what s importantin selectingan ESDdevice,see the TI applicationnoteDesignConsiderationsfor System-LevelESDC ircuitProtection(SLYT492).

2 TestLevelsTI usesindustrystandardESDtest generatorscalibratedto the IEC test waveformto TI ESDprotectiondevicesare designedto complyto Level4 testingor higherfor contactdischargeand mostcomplyto Level4 or higherfor air Table1 for levelsspecifiedby theIEC standardand Figure1 for the IEC ESDT estingLevelsContactDischargeAir DischargeLevelTestVoltage( kV)TestVoltage( kV)1222443684815 XCustomCustom1 SLVA711 June2015 IEC 61000-4-xTestsfor TI s ProtectionDevicesSubmitDocumentationFeed backCopyright 2015,TexasInstrumentsIncorporatedIP30201 0 Current (A)153045607590100 Time (ns)tf10 %IP90 %IPI30I60 IEC IdealContactDischargeCurrentWaveformat 8 kVTestingis performedby chargingthe 150-pFdischargecapacitorand dischargingit througha 330- resistorinto the striketip. Contactdischargeis performedby touchingthe dischargetip directlyto the pinundertest thentriggeringthe ,air dischargeis performedby triggeringthe gun thenmovingthe dischargetip towardsthe pin undertest until TI ESDtest benchsetupcomplieswith the IEC standardand is shownin Figure2 DeviceUnderTest(DUT)is placedon a horizontalcouplingplane(HCP)with insulationin powerconnectionsare madeon the non-conductivetableand two 470-k resistorsare usedto connectthe HCPto the groundreferenceplane(GRP).

3 The ESDgeneratoris groundedto the GRPand dischargesareperformeddirectlyat the DUTP rintedCircuitBoard(PCB).The typicalDUTPCB usedfor testingourprotectiondevicesis a breakoutboardshownin Figure3 with a socketfor easytestingof TI protectiondeviceis insertedinto the socketand deviceis clamped,theESDgun strikesat the connectoror otherspecifiedtest 61000-4-xTestsfor TI s ProtectionDevicesSLVA711 June2015 SubmitDocumentationFeedbackCopyright 2015,TexasInstrumentsIncorporatedD-Conne ctorWireSocketDUTPCBNon-conductive 61000-4-2 SystemESDI mmunityFigure2. SystemLevelESDTestSetupFigure3. DUTPCBS etup3 SLVA711 June2015 IEC 61000-4-xTestsfor TI s ProtectionDevicesSubmitDocumentationFeed backCopyright 2015,TexasInstrumentsIncorporatedAC if applicableEFTP ulse GeneratorGRP ConnectionPower/SignalCapacitivecoupling clampGround PlaneDUTPCBIEC 61000-4-4 EFT 61000-4-4 EFT 61000-4-4 OverviewIndustrial,officeand evenhouseholdapplicationswidelyuse cablesin powerdeliveryand eventsrangingfromthe environmentand fromsurroundingpowercablesor datacablesmay interruptdatacommunicationsthroughinduct iveor immunitythereforebecomesimportantfor IEC 61000-4-4is an IEC standarddesignedto test fast transientor burstimmunityat the ESDimmunity(standardIEC 61000-4-2)and surgeimmunity(standardIEC 61000-4-5)

4 , fast transient/burstimmunityspecifiessystemim munityto ,systemlevelEFT immunitytestsare requiredfor networkingsystems,field cabletransmissionsand 61000-4-4 TestSetupand TestProcedureThe IEC 61000-4-4standarddefinesthe EFT immunitytests,set-upprocedures,and test EFTimmunitytest setupfor IO portsis shownin Figure4. A burstsignalfroma burstgeneratoris sent throughthe test cable(insidea capacitivetrench)and is measuredthrougha coupleddatacable(insidethe sametrench)whichis connectedto the DUTis mountedto a test the DUTmountmethod,referto Figure3 testsare intrinsicallycoupledwith a testerand appliedto the the applicationenvironmentand applicationtype,the pulsegeneratorhasvaryingtest voltagelevelsdependingon the an example,2 kV is typicallyspecifiedforindustrialdata/sign allines(seeTable2 for all test levels).Testpulsesare definedin Figure5 by in IEC 61000-4-4standardare specifiedas repeatedpulses/burstsfor 15 mswith eachsinglepulse5 50 ns, as in IEC 61000-4-4IO PortTestSet UpTable2.

5 IEC61000-4-4stresslevelsPeakAmplitudePow erSupplyPortI/O, Signal,Data& ControlLinesLevelVCC(kV)ISC(A)VCC(kV)ISC (A) 61000-4-xTestsfor TI s ProtectionDevicesSLVA711 June2015 SubmitDocumentationFeedbackCopyright 2015,TexasInstrumentsIncorporated15 ms300 msVoltage5 x 50 61000-4-4 EFT 61000-4-4 TypeBurstSuppressionThroughTVSD iodesThe amountof energyof EFT eventsis aroundseveralhundredsof theseenergylevelscan corruptdatatransmittedin manysituationsfromhouseholdsto industrialenvironments;therefore,a goodsystemdesignrequiresEFT designedto suppresstransientvoltagepulseswith powerlevelsthat vary fromtens ofmilli-Joulesto hundredsof Joules;therefore,they can handlenot only ESDand surgeevents,but alsoEFT mechanismfor TVSdiodesto suppressEFT burstsare intrinsicallythe sameas ESDand high percentageof TI s ESDprotectionsolutionsare capableand specifiedwith IEC 61000-4-4performance,with a widevarietyin the numberof protectionchannelsas well as variousworkingvoltagesto accommodatea widevarietyof IEC 61000-4-4 Burstsand Waveforms3 IEC 61000-4-5 61000-4-5 OverviewThe IEC 61000-4-5introducesthe testingand measurementtechniquesof a surgeimmunitytest.

6 Surge,unlikeESDand EFT,has a longerperiodand a usuallyproducedby thepowersystemswitchingactivitiesor powersystemswitchingactivitiesarelocalmi norswitchingactivitiesand load changes;Mainpowersystemdisturbanceslike capacitorbankswitching;Systemfaultssucha s shortingevents;and a disturbedgroundcausedby directlycoupledlightningto the outdoorequipmentand circuits;indirectlightningthat createselectromagneticfieldswhichthus inducestransientsto the circuit ;a grounddisturbancethat is createdby lightningcoupledto the ,we vealso seenan increaseof surgerequirementin goodexampleis the USBVBUS surgeprotectionto suppressplugging/unpluggingtransients(fo r VBUS surgeand overvoltageprotection,see TPD1S514). The IEC 61000-4-5providesthe guidelineof standardteststo representthesecasesandto evaluateif the equipmentsurvivesthe Choosethe RightProtectionDevicefor Surge?Choosingthe rightdeviceto protectcircuitryto withstandsurgehas a significantimpacton the reliabilityofthe do that,VCLand IPPspecsare the two mainfactorsto be the peakclampingvoltagethat the protectiondeviceprovidesduringthe protectiondevicethat hasa lowerVCLvaluethanthe max toleranceof the the peakcurrenta systemtakesduringthe the IPPratingof the protectiondeviceexceedsthe levelof thestandardthe systemis designedto IEC 61000-4-5has two surgepulsedurationsspecified.

7 5 SLVA711 June2015 IEC 61000-4-xTestsfor TI s ProtectionDevicesSubmitDocumentationFeed backCopyright 2015,TexasInstrumentsIncorporatedIEC 61000-4-5 s and 10/1000 s, bothof whichdefinethe shapeof the latteris IPPvaluerelatedto the 8/20- s surgeis largerthanthat relatedto the10/1000- s ,a protectiondeviceis able to take choosingthe IPPrelatedto the rightsurgeperiodwithoutan unnecessaryoverheadin marginis essentialfor a cost and 61000-4-5 TestSetupand TestProcedureTI s surgetestsare compliantwith the IEC whatenvironmenta systemis designedfor, the IEC 61000-4-5specifiesseverallevelsof testsin associationwith an chartbelowsummarizesthe surgevoltagesof differenttest levelsand and up, the applicationsrequireprotectiondevicesto minimizethe surgeenergyseenby TestLevelsLevelOpen-CircuitTestVoltage 10% (1)Custom(1)X can be any levelabove,belowor in betweenthe levelcan be specifiedin the productstandard.

8 Class1: Partlyprotectedelectricalenvironment. Class2: Electricalenvironmentwherethe cablesare well-separated,evenat shortruns. Class3: Electricalenvironmentwherecablesrun in parallel. Class4: Electricalenvironmentwherethe interconnectionsare run as outdoorcablesalongwith powercables,and the cablesare usedfor bothelectronicand electriccircuits. ClassX: Specialconditionsspecifiedin the levelof surgevoltage,togetherwith the impedance(Req) fromthe surgestrikedetermineshow muchsurgecurrentthe equipmentsetupsentaildifferentimpedances usedin the 2- impedancemodelsthe sourceimpedanceof a low voltagepowersupplyand is the inherentsourceimpedanceof the combinationalwaveformgenerator(CWG).It representsthe casewherethe surgeiscoupledontothe powerAC or DC mainsin a impedancegivesthe highestlevelofsurgecurrentfor a 12- (2 is the CWGsourceimpedance,10 fromcouplingnetwork)impedancemodelstheim pedanceof the powersourceand the groundnetworkand is usedwhenthe surgehappensbetweenthe mainsand the 42- (2 is the CWGsourceimpedance,40 fromcouplingnetwork)impedancerepresentst heimpedancebetweenall the otherlinesand one examplewherethis impedancelevelis 61000-4-xTestsfor TI s ProtectionDevicesSLVA711 June2015 SubmitDocumentationFeedbackCopyright 2015, time:Time to half-value:T = s 30%r!

9 T = 50 s 20% DCRCCCRs1 RmLrRs2 + 61000-4-5 Lightning/SurgeImmunityBelowis a matrixthat providesa quickreferenceof the surgecurrentlevelsof differentsurgevoltagesand the protectiondevicesthat are not usedin the high surgeapplications,(for example,audiolinesand pushbuttons,etc.)it s still goodto includethe surgeratingfor , a bidirectionalsignalclampingdevicewith a surgecurrentof 6 A (8/20 s).Table4. MaximumPeakCurrentValuesDependingon VoltageLeveland ReqClass1 Class2 Class3 Class4500 V1 kV2 kV4 kVReq = 42 12 A24 A48 A96 AReq = 12 42 A84 A167 A334 AReq = 2 250 A500 A1000A2000 ATI usesa PCBboardwith the DUTfor the surgetests,as in Figure3. In thesetests,surgepulsesaregeneratedby a IEC 61000-4-5specifiestwo typesof s CWGis usedto testthe portsof s CWGis for all samelevelof peakpower,the 10/700 s surgecontainsmoreenergydue to a simplifiedCWGhas a powersupplythat chargesthe couplingcapacitor,CC, througha closingof the switch,CCdischargesthrougha pulseshapingnetworkincludingRs1, Rm, Lrand Rs2.

10 Thevaluesof thesecomponentsare tunedto yieldthe compliancewaveformsin the shortcircuitand opencircuitconditionsaccordingto the IEC Simplifiedcircuitdiagramof the CWG( s)The opencircuitvoltagewaveformof the s shapehas a fronttime of s and a time to halfvalueof 50 Waveformof open -circuitvoltage( s) at the outputof the CWG7 SLVA711 June2015 IEC 61000-4-xTestsfor TI s ProtectionDevicesSubmitDocumentationFeed backCopyright 2015,TexasInstrumentsIncorporatedACpower supplynetworkDecoupling networkEarth referenceDUTL1L2L3 NPELS1S2C = 18 F!Combination wavegeneratorFront time:Time to half-value:T = 8 s 20%r! T = 20 s 20% 61000-4-5 shortcircuitcurrentwaveformof the samegeneratorhas an 8- s fronttime and a 20- s time to Waveformof short -circuitcurrent( s) at the outputof the CWGThe circuitof the 10/700- s CWGis differentto that of the s be foundinthe IEC Coupling/DecouplingNetwork(CDN)is anotherintegralpart of the test couplingnetworkcouplesthe surgepulsegeneratedby the CWGto the DUTwhereasthe decouplingnetworksits betweenthe CWGand the biasingequipmentto makesurethat the biasingequipmentdoesnot get damagedduringthe IEC 61000-4-5definesthe impedancesusedin the couplingnetworksin a couplingnetworkis couplingthe surgebetweenthe 18- F capacitoris usedto couplethe surgeto the Exampleof test setupfor capacitivecouplingon lines(3 phases).