Managing Cable System Quality Control - IMCORP

1 Managing Cable System Quality Control : Promoting a New Level of Cable System Longevity Part II Ben Lanz Director, Applications Engineering M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 10 root cause categories Database and statistics 6 Sigma Performance Pareto of anomalies Pictures of anomalies Fishbone diagram Recommendations 2 O V E R V I E W M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 3 S Y S T E M FA I L U R E 1 0 R O O T C ATA G O R I E S M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l >125.

2 000 assessments 5kV to 500kV class systems >50,000 new solid dielectric Cable systems ~1% of Cable segments w/ 1 substandard location no visible anomalies in the field with laboratory analysis pictures 100% associated with voids 65% associated with a stress enhancements 29% mfgrs attribute missed PD sites to inadequate degassing 4 I M C O R P D ATA B A S E M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 5 T Y P I C A L R E P O R T M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 6 6 S I

3 G M A P E R F O R M A N C E ? 3,000ft reel lengths A B C D E F 6 Leading Manufacturers M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 7 PA R E TO O F A N O M A L I E S Pareto categories are mutually exclusive Insulation Shield Conductor Shield Insulation M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 8 PA R E TO O F A N O M A L I E S Anomalies not mutually exclusive 0% 5% 10% 15% 20% 25% 30% 35% 40% 45% M a n a g i n g C a b l e S

4 Y s t e m Q u a l i t y C o n t r o l 9 M F G R . A N O M A L I E S 4 FA I L U R E M O D E S Void PD ET Failure Low SE WT Aligned 2nd SE ET/PD Failure High SE ET/PD Failure Event Void PD ET Failure New System Failure Modes Aged System Failure Modes 1 2 4 3 SE= Stress Enhancement ET = Electrical Tree WT = Water Tree Aged New M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 10 R E L I A B I L I T Y C O N C E R N S M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 11 R E L I A B I L I T Y C O N C E R N

5 S M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 12 R E L I A B I L I T Y C O N C E R N S M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 13 R E L I A B I L I T Y C O N C E R N S Issues likely found on new systems Issues likely found on aged systems M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l Anomaly: Shrink back after extreme loading event(s) and overheating connector 14 A G E D E X A M P L E C A S E S T U D Y M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l Anomaly: WT associated with a protrusion initiating an ET 15 A G E D E X A M P L E C A S E S T U D Y Water Tree Electrical Tree M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l Anomaly.

6 WT associated with a protrusion initiating an ET 16 A G E D E X A M P L E C A S E S T U D Y Protrusion Water Tree Electrical Trees M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l Anomaly: WT associated with a protrusion initiating an ET 17 A G E D E X A M P L E C A S E S T U D Y Former water tree after silicone injection Electrical Tree M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l Anomaly: WT growing from contaminate initiating an electrical tree 18 A G E D E X A M P L E C A S E S T U D Y Water Tree Bowtie Electrical Tree Void/ Contaminant M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l Anomaly: Insulation shield protrusion creating void on accessory interface 19 N E W C A S E S T U D Y Tracking Groove in insulation IS Protrusion M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l Anomaly.

7 Cable out-of-round causes semicon scoring tool to gouge insulation 20 N E W E X A M P L E C A S E S T U D Y M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 21 N E W C A S E S T U D Y Anomaly: Insulation shield damage ~48pC ~400pC ~21pC M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l Anomaly: insulation shield delamination 22 N E W C A S E S T U D Y ~37pC M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 23 N E W C A S E S T U D Y Anomaly: Conductor shield voids/protrusion ~15pC M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 24 E X A M P L E C A S E S T U D Y Anomaly: Insulation shield protrusion and void M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 25 E X A M P L E C A S E S T U D Y Anomaly.

8 Conductor shield void/protrusion M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 26 N E W C A S E S T U D Y Anomaly: Insulation contaminant ~40pC M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 27 E X A M P L E C A S E S T U D Y Anomaly: insulation shield delamination ~7pC M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 28 E X A M P L E C A S E S T U D Y Anomaly: Amber contaminants interfacial voids ~93pC M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 29 E X A M P L E C A S E S T U D Y Anomaly: Conductor shield protrusion in with voids at the interface M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 30 E X A M P L E C A S E S T U D Y ~17pC Anomaly: Semicon damage M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 31 E X A M P L E C A S E S T U D Y Anomaly.

9 Conductor shield voids and protrusions ~49pC ~7pC M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 32 E X A M P L E C A S E S T U D Y 9pC Anomaly: Conductor shield voids and protrusions M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 33 E X A M P L E C A S E S T U D Y Anomaly: Insulation shield protrusion M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 34 E X A M P L E C A S E S T U D Y Anomaly: Insulation shield protrusion and insulation voids M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 35 E X A M P L E C A S E S T U D Y Anomaly: Insulation shield damage during factory repair ~11pC M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 36 E X A M P L E C A S E S T U D Y Anomaly: Conductor shield fall in with void M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 37 E X A M P L E C A S E S T U D Y Anomaly.

10 Insulation damage cut under semicon layer ~100pC M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 38 E X A M P L E C A S E S T U D Y Anomaly: Large void in insulation M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 39 E X A M P L E C A S E S T U D Y Anomaly: Insulation shield delamination and pick off on insulation ~6pC M a n a g i n g C a b l e S y s t e m Q u a l i t y C o n t r o l 40 E X A M P L E C A S E S T U D Y Anomaly: Contaminant with interfacial voids (Amber?)