Example: quiz answers

Moisture/Reflow Sensitivity Classification for …

IPC/ jedec J-STD-020 EMoisture/ReflowSensitivity Classificationfor nonhermetic SurfaceMount DevicesA joint standard developed by the IPC Plastic Chip Carrier Cracking TaskGroup (B-10a) and the jedec Committee on Reliability TestMethods for Packaged DevicesUsers of this standard are encouraged to participate in thedevelopment of future :JEDECS olid State Technology Association3103 North 10th Street, Suite 240-SArlington, VA 22201-2107 Tel 703 703 Lakeside Drive, Suite 309 SBannockburn, Illinois60015-1249 Tel 847 847 :IPC/ jedec -March 2008 IPC/ jedec J-STD-020D -August 2007 IPC/ jedec J-STD-020C -July 2004 IPC/ jedec J-STD-020B -July 2002 IPC/ jedec J-STD-020A -April 1999J-STD-020 - October 1996 jedec JESD22-A112 IPC-SM-786A - January 1995 IPC-SM-786

IPC/JEDEC J-STD-020E Moisture/Reflow Sensitivity Classification for Nonhermetic Surface Mount Devices A joint standard developed by the IPC

Tags:

  Sensitivity, Classification, Flowers, Jedec, Moisture, Nonhermetic, Moisture reflow sensitivity classification for nonhermetic, Moisture reflow sensitivity classification for, Jedec j

Information

Domain:

Source:

Link to this page:

Please notify us if you found a problem with this document:

Other abuse

Transcription of Moisture/Reflow Sensitivity Classification for …

1 IPC/ jedec J-STD-020 EMoisture/ReflowSensitivity Classificationfor nonhermetic SurfaceMount DevicesA joint standard developed by the IPC Plastic Chip Carrier Cracking TaskGroup (B-10a) and the jedec Committee on Reliability TestMethods for Packaged DevicesUsers of this standard are encouraged to participate in thedevelopment of future :JEDECS olid State Technology Association3103 North 10th Street, Suite 240-SArlington, VA 22201-2107 Tel 703 703 Lakeside Drive, Suite 309 SBannockburn, Illinois60015-1249 Tel 847 847 :IPC/ jedec -March 2008 IPC/ jedec J-STD-020D -August 2007 IPC/ jedec J-STD-020C -July 2004 IPC/ jedec J-STD-020B -July 2002 IPC/ jedec J-STD-020A -April 1999J-STD-020 - October 1996 jedec JESD22-A112 IPC-SM-786A - January 1995 IPC-SM-786 - December 1990 Table of.

2 And Equivalent *Acoustic Microscope .. *Area Array Package .. * Classification Temperature (Tc) .. *Damage (Orientation) .. Area .. Life .. Body Hot Air (Orientation) .. s Exposure Time (MET).. Sensitivity Classification .. Sensitivity Level (MSL) .. *Package Thickness .. *Peak Package Body Temperature (Tp) .. * Surface .. 22 APPLICABLE .. Industry Standards .. Humidity Chambers .. Reflow Equipment .. Convection (Preferred).. Microscope.

3 Apparatus (Optional).. Thermocouple TemperatureMeasurement .. 44 Temperatures (Tc) .. with Pb-Free AssemblyRework .. Requirements .. (Qualified Package withoutAdditional Reliability Testing) .. and Rework .. Electrical Inspection .. Soak .. External Visual .. Electrical Test .. Acoustic Criteria after Reflow Simulation .. Requiring Further Evaluation .. Induced Body Warpage duringBoard Assembly of Substrate BasedPackages ( BGA, LGA, etc.).. Die with Polymer Packages.

4 107 Moisture/Reflow 108 OPTIONAL WEIGHT GAIN/LOSS Gain .. Curve .. Points .. Weight .. Soak .. Curve .. Points .. 129 ADDITIONS AND 12 January 2015 IPC/ jedec J-STD-020 EvANNEX 13 ANNEX 14 FiguresFigure 5-1 Classification Profile (Not to scale) .. 8 TablesTable 4-1 SnPb Eutectic Process ClassificationTemperatures (Tc) .. 4 Table 4-2Pb-Free Process ClassificationTemperatures (Tc) .. 5 Table 5-1 moisture Sensitivity 7 Table 5-2 Classification Profiles .. 8 Table B-1 Major Changes from Revision D toRevision E.

5 14 IPC/ jedec J-STD-020 EJanuary 2015viMoisture/Reflow Sensitivity Classificationfor nonhermetic Surface Mount Devices1 PURPOSEThe purpose of this standard is to identify the Classification level of nonhermetic surface mount devices (SMDs) that aresensitive to moisture -induced stress so that they can be properly packaged, stored, and handled to avoid damage duringassembly solder reflow attachment and/or repair standard may be used to determine what Classification level should be used for Surface Mount Device (SMD) packagequalification.

6 Passing the criteria in this test method is not sufficient by itself to provide assurance of long-term ( moisture Sensitivity level) ratings generated by this document are utilized to determine the soak conditions for pre-conditioning as per :A related document, J-STD-075 ( Classification of Non-IC Electronic Components for Assembly Processes) identifiesand includes PSL (process sensitive level) Classification requirements for non-ICs (non-integrated circuits) in addition to ref-erencing MSL ( moisture Sensitivity level) Classification requirements from this document.

7 Some ICs may be process sensi-tive. Please refer to J-STD-075 for potential future PSL Classification requirements for ScopeThis Classification procedure applies to all nonhermetic SMDs in packages, which, because of absorbed mois-ture, could be sensitive to damage during solder reflow. The term SMD as used in this document means plastic encapsulatedsurface mount packages and other packages made with moisture -permeable materials. The categories are intended to be usedby SMD producers to inform users (board assembly operations) of the level of moisture Sensitivity of their product devices,and by board assembly operations to ensure that proper handling precautions are applied to Moisture/Reflow sensitivedevices.

8 If no major changes have been made to a previously qualified SMD package, this method may be used for reclas-sification according to standard cannot address all of the possible component, board assembly and product design combinations. However, thestandard does provide a test method and criteria for commonly used technologies. Where uncommon or specialized compo-nents or technologies are necessary, the development should include customer/manufacturer involvement and the criteriashould include an agreed definition of product packages classified to a given moisture Sensitivity level by using procedures or criteria defined within any previousversion of J-STD-020, JESD22-A112 (rescinded), or IPC-SM-786 (rescinded)

9 Do not need to be reclassified to the currentrevision unless a change in Classification level or a higher peak Classification temperature is desired. Annex B provides anoverview of major changes from Revision D to Revision E of this :If the procedures in this document are used on packaged devices that are not included in this specification s scope,the failure criteria for such packages must be agreed upon by the device supplier and their end BackgroundThe vapor pressure of moisture inside a nonhermetic package increases greatly when the package isexposed to the high temperature of solder reflow.

10 Under certain conditions, this pressure can cause internal delamination ofthe packaging materials from the die and/or lead-frame/substrate, internal cracks that do not extend to the outside of thepackage, bond damage, wire necking, bond lifting, die lifting, thin film cracking, or cratering beneath the bonds. In the mostsevere case, the stress can result in external package cracks. This is commonly referred to as the popcorn phenomenonbecause the internal stress causes the package to bulge and then crack with an audible pop.


Related search queries