Transcription of Powder diffraction optics for SmartLab X-ray …
1 1. IntroductionRigaku SmartLab is a multipurpose, fully-automatedhorizontal X-ray diffractometer that allows many typesof measurements and evaluations of materials rangingfrom powders to thin films. rigaku s expansion systemand Cross Beam optics (CBO) system enableconfiguration of a wide range of optics , while theSmartLab Guidance control software permits easyswitching between optics for added many optics systems offered by rigaku forSmartLab include CBO system incorporating aparabolic multilayer mirror, CBO-E system incorpo-rating an elliptical multilayer mirror, and opticsconfigured with the Ka1 unit with a Johansson Gecrystal for monochromatization of incident X-rays to the Ka1, designed to measure Powder samples. Thesesystems allow the user to configure the ideal optics forspecific measurement or evaluation purposes.
2 The newand unique Ka1 system enables various types ofmeasurement while maintaining samples in a CBO systemThe optics of the CBO system permits easy switchingof incident X-rays by simply changing the selection systems are available: The CBO (Fig. 1) lets theuser select the Bragg-Brentano focusing method orparallel beam method using a parabolic multilayermirror, while the CBO-E (Fig. 2) lets the user select theBragg-Brentano focusing method or convergent beammethod using an elliptical multilayer Bragg-Brentano opticsThe Bragg-Brentano optics enables easy acquisitionof high resolution and high intensity data by thereflection method (Fig. 3). It is generally used forqualitative and quantitative analysis of Powder Parallel beam opticsThe parallel beam optics allows accuratemeasurement of diffracted X-ray positions unaffected bysample shape (Fig.)
3 4). It is generally used to analyzepowder sample profiles and measure the degree ofpreferred orientation, as well as to measure Convergent beam opticsThe convergent beam optics enables high resolutionmeasurements by the transmission method (Fig. 5). It is used to measure samples with low absorptionThe rigaku Journal, 26(2), 201029 Powder diffraction optics for SmartLab X-ray diffractometerNew productsFig. diagram of diagram of diagram of CBO Bragg-Brentano diagram of CBO parallel beam diagram of CBO-E convergent and preferred orientation, such aspharmaceuticals. Diffracted X-rays are focused on thedetector surface for efficient measurement whencombined with the D/teX Ultra 1D high-speed systemRigaku s expansion system also enables to install theKa1 unit (Fig.
4 6). The user can easily switch betweenthe conventional Kaand new Ka1 optics byinstalling/removing the Ka1 unit. Either of the opticscan be selected depending on the purpose ofmeasurements using your incident X-rays are monochromatized to Ka1,even overlapped diffraction peaks can easily bedecomposed. The peak positions, widths, and intensitieswill be determined more precisely in the diffractionpatterns obtained using the Ka1 optics than using theconventional Ka1 optics . The Ka1 unit is recommendedto be used for indexing or ab initiostructure analysis,which requires high-resolution system CBO systemThe Ka1 system incorporates a Johansson Ge crystalfor monochromatization. To allow use of the CBOsystem without modification, the focus position of theKa1 system is designed to align with the conventionalfocus position.
5 Simply by changing the selection slit, theuser can direct X-rays monochromatized to Ka1 (Fig. 7)to Bragg-Brentano optics (Fig. 8), parallel beam optics (Fig. 9), or convergent beam optics (Fig. 10).X-rays monochromatized to Ka1 can be used with the Bragg-Brentano focusing method and convergentbeam method whereby diffracted X-rays are focused onthe detector surface for efficient measurement whencombined with the D/teX Ultra 1D high-speed to conventional monochromatization methods,this achieves faster high intensity measurements. Pairing the Ka1 unit with the CBO system lets usersconfigure the ideal optics for the specific purpose of ameasurement or rigaku Journal, 26(2), 2010 Powder diffraction optics for SmartLab X-ray diffractometerFig. of Ka1 optics (Si (4 0 0)).Fig. diagram of Ka1 unit convergent diagram of Ka1 unit parallel diagram of Ka1 unit Bragg-Brentanofocusing method.
