Example: tourism industry

SMART Attribute Details - Kingston Technology

SMART Attribute DetailsSMART Attribute Details2 SMART Attribute DetailsProvides a detailed description of SMART Attribute support and how each may be SUV400S37 SMART Attribute DetailsIDHEXA ttribute NameDescription101hRead Error RateThis Attribute counts the total amount of (correctable, uncorrectable) ECC error events over the life of the drive. 505hReallocated Sector Count This Attribute is the total count of any sector reallocation event (page or block level) caused by Program/Read Equation: 100 (100 * reallocated sector count / total amount of spare sectors) 909hPower On HoursThis Attribute is used for the hourly count of power on including idle and low power Cycle Count This Attribute counts power cycles, including unsafe power Reserved Block CountThis Attribute counts the number of reserved blocks used to replacebad Fail CountThis Attribute is used to count the number of NAND program failure eventsover the life of the Fail CountThis Attribute counts the number of NAND erase fails over the life ofthe Power O

SMART ttribut 2 SMART Attribute Details Provides a detailed description of SMART Attribute support and how each may be used. Kingston® SUV400S37 SMART Attribute Details

Tags:

  Smart, Details, Attribute, Smart attribute details

Information

Domain:

Source:

Link to this page:

Please notify us if you found a problem with this document:

Other abuse

Transcription of SMART Attribute Details - Kingston Technology

1 SMART Attribute DetailsSMART Attribute Details2 SMART Attribute DetailsProvides a detailed description of SMART Attribute support and how each may be SUV400S37 SMART Attribute DetailsIDHEXA ttribute NameDescription101hRead Error RateThis Attribute counts the total amount of (correctable, uncorrectable) ECC error events over the life of the drive. 505hReallocated Sector Count This Attribute is the total count of any sector reallocation event (page or block level) caused by Program/Read Equation: 100 (100 * reallocated sector count / total amount of spare sectors) 909hPower On HoursThis Attribute is used for the hourly count of power on including idle and low power Cycle Count This Attribute counts power cycles, including unsafe power Reserved Block CountThis Attribute counts the number of reserved blocks used to replacebad Fail CountThis Attribute is used to count the number of NAND program failure eventsover the life of the Fail CountThis Attribute counts the number of NAND erase fails over the life ofthe Power Off CountThis Attribute counts power off events (unsafe system shutdowns)

2 Without Cache Flush or Meta Data Fail Count Worst DieThis Attribute counts the program failures for the die which has exhibited the most B0hErase Fail Count Worst DieThis Attribute counts the erase failures for the die which has exhibited the most Reserved Block Count worst DieThis Attribute counts the number of reserved blocks used to replace badblocks for the worst Reserved Block Count (SSD Total) This Attribute counts the reserved blocks remaining for the entire Uncorrectable ErrorsThis Attribute counts the number of uncorrectable ECC errors reported by the drive. 194C2hTemperatureThis Attribute reports drive Value Bytes[1-0]: Current[3-2]: Min[5-4]: Max195C3hOn-the-Fly ECC Uncorrectable Error CountThis Attribute counts the total amount of (correctable, uncorrectable) ECC error events over the life of the Event CountThis Attribute counts the number of reallocation events that have taken place on this Attribute Details3 IDHEXA ttribute NameDescription197C5hPending Sector CountThis Attribute counts unrecoverable units (page/blocks) based on the recovery scheme.

3 199C7hUDMA CRC Error CountThis Attribute counts CRC errors that have occurred on the SATA Read Error RateThis Attribute provides the Uncorrectable ECC rate for the current power/reset period. 204 CChSoft ECC Correction RateThis Attribute provides the Soft ECC rate for the current power/reset Life LeftThis Attribute provides an indication of the remaining life of the SSD basedon the number of program/erase cycles. Normalized Equation: 100 - ((100 * (Average Erase Count / NAND RatedProgram/Erase Cycle))241F1hGB Written from InterfaceThis Attribute counts data written by the host (in GB)242F2hGB Read from InterfaceThis Attribute counts data read by the host (in GB) 250FA hTotal Number of NAND Read Retries This Attribute counts the number of read retries performed.)

4 2015 Kingston Technology Corporation, 17600 Newhope Street, Fountain Valley, CA 92708 USA All rights reserved. All trademarks and registered trademarks are the property of their respective owners. Printed in the USA


Related search queries