Microelectronics Reliability: Physics-of-Failure Based ...

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National Aeronautics and Space Administration Microelectronics reliability : Physics-of-Failure Based Modeling and Lifetime Evaluation Mark White Jet Propulsion Laboratory Pasadena, California Joseph B. Bernstein University of Maryland College Park, Maryland Jet Propulsion Laboratory California Institute of Technology Pasadena, California JPL Publication 08-5 2/08. National Aeronautics and Space Administration Microelectronics reliability : Physics-of-Failure Based Modeling and Lifetime Evaluation NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance Mark White Jet Propulsion Laboratory Pasadena, California Joseph B. Bernstein University of Maryland College Park, Maryland NASA WBS: JPL Project Number: 102197. Task Number: Jet Propulsion Laboratory 4800 Oak Grove Drive Pasadena, CA 91109.

Preface iv more advanced microelectronic technologies, and provide in-depth descriptions on how to implement into reliability equivalent circuits for spacecraft, planets, instrument, C-matrix, events

  Reliability, Physics, Failure, Microelectronics reliability, Microelectronics, Physics of failure, Spacecraft