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MIL-STD-883E, Test Method Standard for Microcircuits

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0,/ 67' ( '(&(0%(5 '(&(0%(5 683(56(',1* 683(56(',1*0,/ 67' '0,/ 67' ' 129(0%(5 129(0%(5 '(3$570(17 2) '()(16('(3$570(17 2) '()(16(7(67 0(7+2' 67$1'$5'7(67 0(7+2' 67$1'$5'0,&52&,5&8,760,&52&,5&8,76$06& 1 $ )6& ',675,%87,21 67$7(0(17 $',675,%87,21 67$7(0(17 $ $SSURYHG IRU SXEOLF UHOHDVH GLVWULEXWLRQ LV XQOLPLWHG $SSURYHG IRU SXEOLF UHOHDVH GLVWULEXWLRQ LV XQOLPLWHG 7KH GRFXPHQWDWLRQ DQG SURFHVVFRQYHUVLRQ PHDVXUHV QHFHVVDU\ WRFRPSO\ ZLWK WKLV UHYLVLRQ VKDOO EHFRPSOHWHG E\ 0D\ ,1&+ 3281',1&+ 3281'MIL-STD-883EiiFOREWORD1. This military Standard is approved for use by all Departments and Agencies of the Department of Defense.))))))))))))))))))))))))))))

For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices. The test

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