Standard Test Data Format (STDF) Specification
STDF Specification V4Page iMainMenuStandard Test data Format (STDF) SpecificationVersion 4Table of ContentsClick on any to STDFTeradyne s Use of the STDF SpecificationSTDF Design ObjectivesSTDF Record StructureSTDF Record HeaderRecord Types and SubtypesData Type Codes and RepresentationNote on Time and Date UsageOptional Fields and Missing/Invalid DataSTDF Record TypesNote on Initial Sequence Alphabetical ListingFile Attributes Record(FAR) 16Audit Trail Record(ATR) 17Master Information Record(MIR) 18Master Results Record(MRR) 21Part Count Record(PCR) 22Hardware Bin Record(HBR) 23Software Bin Record(SBR) 25Pin Map Record(PMR) 27Pin Group Record(PGR) 29Pin List Record(PLR) 30Retest data Record(RDR) 32Site Description Record(SDR) 33Table of ContentsSTDF Specification V4Page iiMainMenuWafer Information Record(WIR) 35Wafer Results Record(WRR) 36Wafer Configuration Record(WCR) 38Part Information Record(PIR) 40Part Results Record(PRR) 41Test Synopsis Record(TSR) 43Parametric Test Record(PTR) 45Multiple-Result Parametric Record(MPR) 51
The Standard Test Data Format is intended as a comprehensive standard for the entire ATE industry, not as a description of how Teradyne writes or analyzes test result data. A test system can support STDF without using all the STDF record types or filling in all the fields of the record types it does use.
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