Transcription of Standard Test Data Format (STDF) Specification
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Standard Test Data Format (STDF) Specification
STDF Specification V4 Page iMainMenuStandard Test data Format (STDF) SpecificationVersion 4 Table of ContentsClick on any to STDFT eradyne s Use of the STDF SpecificationSTDF Design ObjectivesSTDF Record StructureSTDF Record HeaderRecord Types and SubtypesData Type Codes and RepresentationNote on Time and Date UsageOptional Fields and Missing/Invalid DataSTDF Record TypesNote on Initial Sequence Alphabetical ListingFile Attributes Record(FAR) 16 Audit Trail Record(ATR) 17 Master Information Record(MIR) 18 Master Results Record(MRR) 21 Part Count Record(PCR) 22 Hardware Bin Record(HBR) 23 Software Bin Record(SBR) 25 Pin Map Record(PMR) 27 Pin Group Record(PGR) 29 Pin List Record(PLR) 30 Retest data Record(RDR) 32 Site Description Record(SDR) 33 Table of ContentsSTDF Specification V4 Page iiMainMenuWafer Information Record(WIR) 35 Wafer Results Record(WRR) 36 Wafer Configuration Record(WCR) 38 Part Information Record(PIR) 40 Part Results Record(PRR) 41 Test Synopsis Record(TSR) 43 Parametric Test Record(PTR) 45 Multiple-Result Pa
The Standard Test Data Format is intended as a comprehensive standard for the entire ATE industry, not as a description of how Teradyne writes or analyzes test result data. A test system can support STDF without using all the STDF record types or filling in all the fields of the record types it does use.
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