Process Average Testing (PAT) , Statistical Yield Analysis ...

Statistical Yield Analysis (SYA) identifies lots of components that yield abnormal distributions, or contain abnormal failure characteristics. 2.) Purpose: Utilizes statistical techniques to identify a wafer, wafer lot, or component assembly lot that exhibits an unusually low yield or an unusually high bin failure rate.

  Analysis, Testing, Process, Statistical, Average, Yield, Process average testing, Yield analysis, Statistical yield analysis