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AUTOMOTIVE ZERO DEFECTS FRAMEWORK
www.aecouncil.comDiscrete Optoelectronic Semiconductors in Automotive Applications 6.1, 6.2 AEC-Q103 Failure Mechanism Based Stress Test Qualification for Sensors in Automotive Applications 6.1, 6.2 AEC-Q104 Failure Mechanism Based Stress Test Qualification for Multichip Modules (MCM) In Automotive Applications 6.1, 6.2