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Basics of X-Ray Powder Diffraction - prism.mit.edu

prism.mit.edu

High Resolution X-Ray Diffraction (HRXRD) Training • HRXRD is used to analyze epitaxial thin films –Can determine composition, strain/relaxation, lattice parameters (in-

  Powder, Diffraction, Of x ray powder diffraction

Basics of X-Ray Powder Diffraction

prism.mit.edu

Our powder diffractometers typically use the Bragg-Brentano geometry. ωωω 2θ22θθ2θ • The incident angle, ω, is defined between the X-ray source and the sample. • The diffraction angle, 2θ, is defined between the incident beam and the detector. • The incident angle ω is always ½ of the detector angle 2θ .

  Powder, Diffraction, Of x ray powder diffraction

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