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5.5 Reliability of Low-Voltage Tantalum Polymer Capacitors

CARTS USA 2005 March 21-24, 2005 Palm Springs, CA. Reliability of Low-Voltage Tantalum Polymer Capacitors Erik K. Reed, Jeffrey N. Kelly, Jonathan L. Paulsen KEMET Electronics Corporation PO Box 5928. Greenville, SC 29606. Tel:864-963-6300. Fax: 864-228-4333. Abstract normal operating conditions. For 100 F, 6V. Tantalum Polymer Capacitors in an EIA 3528-21. This paper briefly reviews earlier work which first case, the test data suggest typical capacitor assessed the Reliability of 6V Tantalum Polymer lifetimes approaching 1,000 years at rated voltage Capacitors . A physics-based acceleration formula and 85oC. that better models the interaction of voltage and temperature stress is presented and discussed. New The accelerated testing strategy and acceleration observations are made about the original test data models employed in this initial assessment of in light of the physics-based acceleration model as Reliability of Tantalum Polymer Capacitors were well as new testing done on 6V Capacitors since the borrowed from accelerated testing work done on original paper was presented.

CARTS USA 2005 March 21-24, 2005 Palm Springs, CA Reliability of Low-Voltage Tantalum Polymer Capacitors Erik K. Reed, Jeffrey N. Kelly, Jonathan L. Paulsen

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  Capacitors, Voltage, 2005, Polymer, Tantalum, Low voltage tantalum polymer capacitors

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