Transcription of Application Note 24 A Simplified Test Set for Op Amp ...
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Application Note 24 A Simplified Test Set for Op Amp ...
LM709. Application Note 24 A Simplified Test Set for Op Amp Characterization Literature Number: SNOA637. A Simplified Test Set for Op Amp Characterization AN-24. National Semiconductor A Simplified Test Set for Application Note 24. M. Yamatake Op Amp Characterization April 1986. INTRODUCTION POWER SUPPLY. The test set described in this paper allows complete quanti- Basic waveforms and dc operating voltages for the test set tative characterization of all dc operational amplifier param- are derived from a power supply section comprising a posi- eters quickly and with a minimum of additional equipment. tive and a negative rectifier and filter, a test set voltage regu- The method used is accurate and is equally suitable for labo- lator, a test circuit voltage regulator, and a function genera- ratory or production test for quantitative readout or for limit tor. The dc supplies will be discussed in the section dealing testing.
BIAS CURRENT TEST A functional diagram of the bias current test circuit is shown in Figure 1. The output of the triangular wave generator and the output of the test circuit, respectively, drive the horizontal
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